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Testing and adjustment system for opto-electronic device - uses two units spaced relatively close with high accuracy but with approximate axial alignment

机译:光电设备的测试和调整系统-使用两个单元,它们之间的距离相对较近,但精度较高,但轴向对齐

摘要

The system for a device with several optical axes and high parallelity requirements e.g. for weapon sights comprises two separate units. One of these incorporates the measuring appts., while the other comprises a multiple mirror group. When the system is set up the distance between the two units has to be set accurately, but their axial alignment can be set approximately. Pref. the first unit has a holder for the test device in front of which a collimator with a deflection mirror is positioned. A test target is fed to the test device via the spaced mirror group and the collimator.
机译:用于具有多个光轴和高平行度要求的设备的系统,例如瞄准具包括两个独立的单元。其中一个包含测量装置,而另一个包含多个反射镜组。设置系统时,必须精确设置两个单元之间的距离,但是可以大致设置它们的轴向对齐。首选第一单元具有用于测试设备的保持器,在该保持器的前面放置具有偏转镜的准直仪。通过隔开的反射镜组和准直仪将测试目标馈送到测试设备。

著录项

  • 公开/公告号FR2469705B1

    专利类型

  • 公开/公告日1984-09-21

    原文格式PDF

  • 申请/专利权人 ELTRO GMBH;

    申请/专利号FR19800021482

  • 发明设计人

    申请日1980-10-08

  • 分类号G01M11/00;F41G1/54;F41G3/32;F41G7/26;

  • 国家 FR

  • 入库时间 2022-08-22 08:45:57

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