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LENGTH MEASURING DEVICE BASED ON PRINCIPLE OF TWO BEAM LASERINTERFEROMETER

机译:基于两束激光干涉仪原理的测长仪

摘要

Length measuring apparatus with position sensor (12), in accordance with the dual beam laser interferometer principle, having a laser light source (16) supplied by a power source (48), a beam splitter (18) disposed in its optical axis for dividing the light beam into a measuring light beam and a reference light beam aligned at an angle thereto, a movable mirror (19) joined to the position sensor and reflecting the measuring light beam parallel to the optical axis with a transverse offset, and an at least partially reflecting additional optical element (20). This optical element (20) can be either in the form of a second mirror or in the form of a second beam splitter. In the area of interference of the beam paths lies at least one photodetector (21) whose output or outputs are connected to an evaluating circuit (37) which has a counting system for counting the light/dark sequences including a detection of direction of movement, and to a digital display system (3). In accordance with the invention, the laser light source is a laser diode (16 ) for the production of laser light which is essentially monomodal both laterally, transversely and longitudinally and has a coherence length that corresponds at least to the length to be measured. The evaluation circuit (37) also has at least one system for eliminating the influences of operational and environmental parameters of the length measuring apparatus. The apparatus is extraordinarily compact, and easy to learn to operate as regards signal processing and regulation. It is consequently suitable both for manual measuring devices (gauges) and for machine devices.
机译:根据双光束激光干涉仪原理的带有位置传感器(12)的长度测量设备,其具有由电源(48)提供的激光光源(16),在其光轴上布置有用于分离的分束器(18)。将光束分为测量光束和与之成角度排列的参考光束,可移动反射镜(19)连接到位置传感器,并以平行于光轴的方式将测量光束横向偏移,并至少部分反射另外的光学元件(20)。该光学元件(20)可以是第二反射镜的形式或第二分束器的形式。在光束路径的干扰区域中,至少一个光电探测器(21)的输出连接到评估电路(37),评估电路具有用于对明暗序列进行计数的计数系统,包括运动方向检测;并连接到数字显示系统(3)。根据本发明,激光源是用于产生激光的激光二极管(16),该激光二极管在横向,横向和纵向上基本上是单峰的,并且相干长度至少对应于待测长度。评估电路(37)还具有至少一个用于消除长度测量设备的操作和环境参数的影响的系统。该设备非常紧凑,并且在信号处理和调节方面易于学习操作。因此,它既适用于手动测量设备(仪表),也适用于机器设备。

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