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Measuring device for a frequency analysis of signal levels within a large dynamic range

机译:在大动态范围内对信号电平进行频率分析的测量设备

摘要

The invention relates to a measuring installation for a frequency analysis of signal levels within a large volume range which is to be extremely fast. The measuring installation has an intermediate frequency amplifier arrangement with two and more selective amplifiers (SV1, SV2, SC3) which are equipped in each case with an automatic amplification regulation. The loop is broad band and contains a controllable attenuator (PR1, PR2, PR3) and a variable-gain amplifier (RV1, RV2, RV3). The band width of the selective amplifiers connected in series is reduced step-by-step in the direction of the signal flow. The regulating variables of the variable-gain amplifiers are summed in an adder (Ad) and supplied to a signal level evaluation and display installation (AA).
机译:本发明涉及一种用于大体积范围内的信号电平的频率分析的测量设备,该测量设备将是非常快的。测量设备具有一个中频放大器装置,该装置具有两个和更多的选择性放大器(SV1,SV2,SC3),分别装有自动放大调节装置。该环路是宽带的,包含一个可控制的衰减器(PR1,PR2,PR3)和一个可变增益放大器(RV1,RV2,RV3)。串联连接的选择放大器的带宽在信号流方向上逐步减小。可变增益放大器的调节变量在加法器(Ad)中求和,并提供给信号电平评估和显示装置(AA)。

著录项

  • 公开/公告号NO150979C

    专利类型

  • 公开/公告日1985-01-23

    原文格式PDF

  • 申请/专利权人 SIEMENS A G BERLIN UND MUENCHEN;

    申请/专利号NO19780004374

  • 发明设计人 SCHWIERZ THEODOR;

    申请日1978-12-22

  • 分类号G01R23/00;

  • 国家 NO

  • 入库时间 2022-08-22 08:14:25

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