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EXPOSURE DOSE RATE EMISSION RATE STACK GAS MONITORING SYSTEM

机译:暴露剂量率排放率叠层气监测系统

摘要

PURPOSE:To facilitate measurement of the exposure does rate on the leeward ground surface, by measuring the exposure does rate in a limited space in the emission source side to obtain a 4pi exposure does rate emission rate and average energy of radioactive rare gas. CONSTITUTION:Radioactive rate gas generated from unclear reactor building 1 is exhausted to the environment from stack 2, and the exhaust rate of the stack is measured continuously by measuring equipment 3. A part of waste gas is flowed continuously to limited space 9 by pump 4, and detector 10 for exposure does rate measurement and detector 11 for gamma-ray flux measurement are inserted to space 9. Detectors 10 and 11 are connected to differential amplifier 14 through logarithmic does indicator 12 and lograte meter 13 respectively. By this constitution, the exposure does rate on the leeward ground surface can be obtained easily by using the 4pi radiation dose rate emission rate calculated from the exposure dose rate measured by detector 10 and average energy of nuclid mixture radioactive rare gas obtained from differential amplifier 14.
机译:目的:为便于测量背风地面上的暴露率,通过测量排放源侧有限空间内的暴露率来获得4pi暴露率和放射性稀有气体的平均能量。组成:从不清晰的反应堆厂房1产生的放射性气体从烟囱2排放到环境中,并通过测量设备3连续测量烟囱的排放率。一部分废气通过泵4连续流入有限的空间9中。在空间9中插入用于曝光率测量的检测器10和用于伽马射线通量测量的检测器11。检测器10和11分别通过对数反射率指示器12和对数计13连接到差分放大器14。通过这种构造,通过使用由检测器10测得的暴露剂量率和由差动放大器14获得的核素混合物放射性稀有气体的平均能量计算出的4pi辐射剂量率发射率,可以容易地获得下风地面上的暴露率。 。

著录项

  • 公开/公告号JPS6111383B2

    专利类型

  • 公开/公告日1986-04-02

    原文格式PDF

  • 申请/专利权人 JAPAN ATOMIC ENERGY RES INST;

    申请/专利号JP19790087191

  • 发明设计人 MINAMI KENTARO;

    申请日1979-07-10

  • 分类号G01T1/16;G01T1/167;

  • 国家 JP

  • 入库时间 2022-08-22 07:49:48

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