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DEVIATION MEASURING INSTRUMENT AND MEASURING INSTRUMENT FOR DEVIATION AND DISTANCE

机译:偏差测量仪器和偏差与距离的测量仪器

摘要

PURPOSE:To simplify the structure of the instrument and to reduce its size by fixing the 1st and the 2nd photodetection plates to an object of measurement in parallel at specific distance from each other, and measuring the position shift and angle deviation of the object of measurement on the basis of detection signals of said photodetection plates. CONSTITUTION:The 1st and the 2nd photodetection plates 10 and 11 output detection signals corresponding to irradiation positions of a light beam 3 respectively, the those detection signals are inputted to a computing element 14 through temperature compensating circuits 12a and 12b and amplifiers 13a and 13b respectively. This computing element 14 measures the position shift and angle deviation of the object 14 of measurement on the basis of said detection signals and they are displayed on respective indication parts 15-18. Consequently, the structure is simplified and reduced in size and troubles are reduced because there is no movable part.
机译:目的:通过将第一光电检测板和第二光电检测板以一定距离彼此平行固定在测量对象上,并测量其位置偏移和角度偏差,以简化仪器的结构并减小其尺寸基于所述光电检测板的检测信号。组成:第一和第二光电检测板10和11分别输出与光束3的照射位置相对应的检测信号,这些检测信号分别通过温度补偿电路12a和12b以及放大器13a和13b输入到计算元件14 。该计算元件14基于所述检测信号来测量测量对象14的位置偏移和角度偏差,并且将其显示在相应的指示部分15-18上。因此,由于没有可动部分,因此简化了结构并减小了尺寸,并且减少了麻烦。

著录项

  • 公开/公告号JPS6126813A

    专利类型

  • 公开/公告日1986-02-06

    原文格式PDF

  • 申请/专利权人 TOTO DENKI KOGYO KK;

    申请/专利号JP19840148384

  • 发明设计人 OMORI EIHACHIRO;

    申请日1984-07-17

  • 分类号G01C5/00;G01B11/00;G01B11/26;G01C15/00;G01S17/08;

  • 国家 JP

  • 入库时间 2022-08-22 07:45:30

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