首页> 外国专利> OUTER DIAMETER DETECTION FOR SINGLE CRYSTAL MADE BY THE LEC METHOD WITH X-RAYS

OUTER DIAMETER DETECTION FOR SINGLE CRYSTAL MADE BY THE LEC METHOD WITH X-RAYS

机译:X射线LEC法检测单晶外直径

摘要

PURPOSE:The value which is obtained by measuring the distance between the side face of the single crystal and the side wall of the crucible opposing to the crystal by roentgenographic pictures is subtracted from the radius of the crucible to detect the outer diameter of the single crystal even with a beam width of X-rays narrower than the outer diameter of the single crystal. CONSTITUTION:A seed crystal 4 is brought into contact with the melt of starting materials for single crystal and the liquid selant 2 and pulled up to allow a single crystal 5 to grow at the center of the crucible. An X-rays generator 7a and an X-ray detector 9a are set oppositely in front and in rear of the crystal 5 so that the X-rays 9a from the generator 7a may pass through the center of the crucible 3 and the side wall opposing to it. Thus, the distance between the side of the single crystal 5 and the opposing side wall of the crucible is measured with a roentogenographic picture of the single crystal 5. The value is subtracted from the radius of the crucible to detect the outer diameter of the single crystal 5.
机译:目的:通过X射线照相术测量单晶的侧面和与晶体相对的坩埚的侧壁之间的距离而获得的值从坩埚的半径中减去以检测单晶的外径即使X射线的光束宽度比单晶的外径窄。组成:晶种4与用于单晶的起始材料和液体selant 2的熔体接触,并向上拉以使单晶5在坩埚中心生长。 X射线发生器7a和X射线检测器9a相对地设置在晶体5的前面和后面,使得来自发生器7a的X射线9a可以穿过坩埚3的中心并且与侧壁相对对此。因此,用单晶5的放射线照相照片测量单晶5的侧面和坩埚的相对侧壁之间的距离。从坩埚的半径减去该值以检测单晶的外径。水晶5。

著录项

  • 公开/公告号JPS6163597A

    专利类型

  • 公开/公告日1986-04-01

    原文格式PDF

  • 申请/专利权人 HITACHI CABLE LTD;

    申请/专利号JP19840184253

  • 申请日1984-09-03

  • 分类号C30B15/26;C30B27/02;

  • 国家 JP

  • 入库时间 2022-08-22 07:44:19

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