Method and device for determining the distances interplanar in the images of an electron diffraction.

摘要

A.procede and device for determining the distances interplanar in the images of an electron diffraction. / p & & p & b.procede characterizes by the use of the needle 2 (the locking of the beam) or accessory that is similar, measuring instruments of translation of the angle of rotation 6 and 7 may comprise a microprocessor 8, a display element and or a printer 9, this assembly allowing the determination of the distances interplanar and the angle relationships in the images of an electron diffraction by the positioning of the shadow of the tip of the needle on each of the points interested of the diffraction. / p & & p & c.dispositif applicable to an electron microscope.