首页> 外国专利> trasdutture metallic tape for measures micrometriche linear magnitudes

trasdutture metallic tape for measures micrometriche linear magnitudes

机译:trasdutture金属带,用于测量微米级线性幅度

摘要

The invention relates to a transducer for the micrometric measurement of linear quantities comprising a support rule, a scale in the form of a very thin continuous metal tape which is kept suspended at its ends under a predetermined constant tension and on which the measurement notches are directly engraved, and a reading head comprising a tape guide groove in which the tape slides freely during the movement of the head relative to the support rule.
机译:用于线性测量的传感器技术领域本发明涉及一种用于线性测量的传感器,该传感器包括支撑尺,非常薄的连续金属带形式的标尺,该金属带的端部在预定的恒定张力下保持悬挂,并且在其上直接具有测量槽口刻有一个磁头,它包括一个导带槽,在导带头相对于支撑尺的运动中,导带在其中自由滑动。

著录项

  • 公开/公告号IT1152526B

    专利类型

  • 公开/公告日1987-01-07

    原文格式PDF

  • 申请/专利权人 GIACOMELLO GIACOMO;

    申请/专利号IT19820023117

  • 发明设计人 GIACOMELLO GIACOMO;

    申请日1982-09-03

  • 分类号G01B;

  • 国家 IT

  • 入库时间 2022-08-22 07:18:45

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号