首页> 外国专利> A process for the determination of the force chak reason of a device for magnetic attachment of werkst} (see fig. 5).

A process for the determination of the force chak reason of a device for magnetic attachment of werkst} (see fig. 5).

机译:确定用于磁性附接装置的力推力原因的过程(参见图5)。

摘要

A method of determining the force characteristics of a device for magnetic fixation of parts positioned on the upper plate (3) of the device where the part (1) interacting with the source of the magnetic field is connected to a force pickup (2) and moved along the upper plate (3) along the testing line (4). The source of the magnetic field is permanently switched on during the test whereas the part (1) is positioned in parallel to the plate (3) with a gap defined by the sensibility of the force pickup (2) and continuously moved along the testing line (4) so as to maintain the value of the gap essentially constant.
机译:确定用于磁性固定装置的力特性的方法,该装置位于该装置的上板(3)上,其中该零件(1)与磁场源相互作用,该装置与力拾取器(2)连接,沿着测试线(4)沿着上板(3)移动。在测试过程中永久性地打开磁场源,而零件(1)平行于平板(3)放置,其间隙由力传感器(2)的灵敏度确定,并沿测试线连续移动(4)从而使间隙值基本保持恒定。

著录项

  • 公开/公告号DE3590735T1

    专利类型

  • 公开/公告日1987-02-19

    原文格式PDF

  • 申请/专利权人

    申请/专利号DE19853590735T

  • 发明设计人

    申请日1985-02-13

  • 分类号G01L5/00;B23Q3/15;

  • 国家 DE

  • 入库时间 2022-08-22 07:12:05

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