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Method for taking the radiation background into account in the determination of radiation intensities of analyzed samples

机译:确定分析样品的辐射强度时考虑辐射本底的方法

摘要

According to the method of the invention, samples undergoing analysis for sorting are irradiated one by one in order to excite X-ray fluorescence. In order to take into account the background radiation, the quality whereof varies according to the frequency of the excited radiation, the radiation peak intensity I.sub.1 is measured, as well as the respective intensity I.sub.2 is measured at the same point of the radiation spectrum but in an essentially wider frequency range than the radiation peak. On the basis of the measured intensities I.sub.1 and I. sub.2 are defined the intensities of the X-ray fluorescence F and the background radiation T, and the ratio of these two is used as the selective criterion when sorting the analyzed samples.
机译:根据本发明的方法,对进行分选分析的样品进行一次辐照,以激发X射线荧光。为了考虑背景辐射,其质量根据激发辐射的频率而变化,测量辐射峰值强度I.sub.1,并在该处测量各自的强度I.sub.2。辐射光谱的同一点,但在实质上比辐射峰宽的频率范围内。根据测得的强度I.sub.1和I.sub.2,定义了X射线荧光F和背景辐射T的强度,当对X射线荧光F和背景辐射T进行分选时,将两者的比率用作选择标准。分析样品。

著录项

  • 公开/公告号US4653081A

    专利类型

  • 公开/公告日1987-03-24

    原文格式PDF

  • 申请/专利权人 OUTOKUMPU OY;

    申请/专利号US19840590720

  • 发明设计人 HEIKKI J. SIPILA;KAI J. LAAMANEN;

    申请日1984-03-19

  • 分类号G01N23/223;G01F23/00;B07C5/00;

  • 国家 US

  • 入库时间 2022-08-22 07:09:30

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