首页> 外国专利> OPERATING STATE MONITORING CIRCUIT FOR IGBT

OPERATING STATE MONITORING CIRCUIT FOR IGBT

机译:IGBT的工作状态监测电路

摘要

PURPOSE:To detect latch-up phenomenon without fail, by monitoring the state by the use of the voltage across and the current between the gate and the emitter of an insulated gate bipolar transistor. CONSTITUTION:In a power converter, etc., such as an inverter for driving an AC motor, the abnormal state of an insulated gate bipolar transistor (hereinafter referred to as IGBT) 1 is detected. For this purpose, a state monitoring circuit 2 connected to a gate drive circuit 3 of an IGBT 1, a current detector 4 and an exclusive OR (EOR) gate 5 are provided. The abovementioned detector 4 outputs logical '1' when the collector current of the IGBT 1 is 0, while the monitoring circuit 2 outputs logical '1' when the gate is 0. Thus, since no collector (emitter) current will be reduced even if the latched-up IGBT 1 sets up the gate voltage for 0. it can be easily detected by logical operation.
机译:目的:通过使用绝缘栅双极型晶体管的栅极和发射极之间的电压以及栅极和发射极之间的电流来监视状态,从而能够可靠地检测闩锁现象。组成:在用于驱动交流电动机的逆变器等功率转换器等中,检测到绝缘栅双极型晶体管(以下称为IGBT)1的异常状态。为此目的,提供了连接到IGBT 1的栅极驱动电路3的状态监视电路2,电流检测器4和异或(EOR)门5。上述检测器4在IGBT 1的集电极电流为0时输出逻辑“ 1”,而监视电路2在栅极为0时输出逻辑“ 1”。因此,即使锁存的IGBT 1将栅极电压设置为0。通过逻辑运算可以很容易地检测到它。

著录项

  • 公开/公告号JPS63124765A

    专利类型

  • 公开/公告日1988-05-28

    原文格式PDF

  • 申请/专利权人 FUJI ELECTRIC CO LTD;

    申请/专利号JP19860268671

  • 发明设计人 KOSAKA KENJI;

    申请日1986-11-13

  • 分类号H02M7/537;H02M1/00;

  • 国家 JP

  • 入库时间 2022-08-22 07:07:48

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号