EXTRACTING DEVICE FOR FEATURE PARAMETER FOR RECOGNITION OF PATTERN

摘要

PURPOSE:To improve the recognition rate of a pattern recognizing device by calculating a new feature parameter from a conventional vector time series pattern. CONSTITUTION:As a result of analysis, a vector time series pattern is stored as a standard pattern successively in a standard pattern storage part 3, and this standard pattern is sent to a feature parameter extracting part 4 and a distribution feature parameter time series is extracted. The standard pattern belonging to the same category name is sent to a representative pattern generating part 4.1, and a feature vector time series for representing the standard pattern of its category name is generated and sent to a matching processing part 4.2. Also, from the standard pattern storage part 3, as well, the standard pattern belonging to the same category name is sent to the matching processing part 4.2. Subsequently, a distortion function of said representative vector time series and each standard pattern is calculated successively and a distribution of a vector in each time point, which is made to correspond by the distortion function is derived, and a distribution feature parameter time series is outputted.