METHOD FOR TESTING ELECTRICALLY ACTIVE IMPURITLES IN SEMICONDUCTOR MATERIALS AND STRUCTURES AND MEASURING ARRANGEMENT FOR IMPLEMENTING METHOD

• 1. 用于最佳安排与蜂窝无线电系统中的测量有关的时隙模式的方法和设备 [P] . 中国专利： CN1325604A . 2001-12-05
• 2. 包含具有正或负氧化还原活性的半电活性材料，用于制备该材料的方法和成套材料，使用这样的半电活性材料的可电控设备和玻璃件 [P] . 中国专利： CN101689002A . 2010-03-31
• 3. METHOD FOR TESTING ELECTRICALLY ACTIVE IMPURITLES IN SEMICONDUCTOR MATERIALS AND STRUCTURES AND MEASURING ARRANGEMENT FOR IMPLEMENTING METHOD [P] . 日本专利： JPH01500613A . 1989-03-01

  机译： 半导体材料和结构中电活性杂质的测试方法以及实施方法的测量安排

• 4. METHOD FOR TESTING ELECTRICALLY ACTIVE IMPURITLES IN SEMICONDUCTOR MATERIALS AND STRUCTURES AND MEASURING ARRANGEMENT FOR IMPLEMENTING METHOD [P] . DD255406A . 1988-03-30

  机译： 半导体材料和结构中电活性杂质的测试方法以及实施方法的测量安排

• 5. METHOD FOR TESTING ELECTRICALLY ACTIVE IMPURITY OF SEMICONDUCTIVE MATERIALS AND STRUCTURES AND MEASURING ARRANGEMENT FOR IMPLEMENTING SAID METHOD [P] . HUT43735A . 1987-11-30

  机译： 测试导电材料和结构的电有源杂质的方法以及实施方法的测量范围

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