System and method for automatically testing integrated circuit memory arrays on different memory array testers

摘要

A system for automatically testing a plurality of memory arrays (25A... 25X) on selected memory array testers (21A... 21X) includes an interactive data entry device (12) for entering array test specifications (20A...20N) including characterizing information, DC testing parameters, AC testing parameters and AC test pattern choices for the array. The test specifications are entered in a format which is independent of a particular tester's characteristics. A universal language generator (14) generates a tester independent universal language instruction sequence (16) for carrying out the prescribed tests based upon the entered test specifications. Associated with each tester is a language translator (19A... 19X) which translates the tester independent universal language instruction sequence into an instruction sequence which is particular to the associated tester (21A ... 21X). The tester dependent instruction sequence (30A ... 30X) may be loaded into the associated tester to produce the test signals for testing the memory array (25A... 25X).