首页> 外国专利> PROCESS FOR THE PRODUCTION OF DIMENSIONAL STABLE STRUCTURES WITH A HIGH ASPECT PROPORTION IN THE 1 MILLIMICRON REGION AND BELOW FOR MICROELECTRONICS, AND USE OF THIS PROCESS FOR THE PRODUCTION OF X-RAY MASKS

PROCESS FOR THE PRODUCTION OF DIMENSIONAL STABLE STRUCTURES WITH A HIGH ASPECT PROPORTION IN THE 1 MILLIMICRON REGION AND BELOW FOR MICROELECTRONICS, AND USE OF THIS PROCESS FOR THE PRODUCTION OF X-RAY MASKS

机译:在1微米级区域内且微电子以下的高纵横比尺寸稳定结构的生产过程,以及该过程在生产X射线面膜中的用途

摘要

1. A process for the production of precisely dimensioned structures with a high aspect ratio in the region of 1,3mm and less, such as are used in particular for the production of masks in micro-electronics, by the irradiation of lacquer layers which are sensitive to photon, electron, X-ray and ion beams, in which the actual layer which is to be structured is structured by means of wet or dry etching procedures by way of auxiliary layers which consist of at least three metals or metal oxides, characterised in that following the production of the layers (2, 3, 4, 5, 6) which are to be structured, until the start of the structuring procedure, an additional layer (7) which passivates the outermost auxiliary layer (6) is applied.
机译:1。一种用于生产尺寸精确的结构的方法,该方法通过在1,3mm及以下的区域中具有高的长宽比,特别是用于微电子学中的掩模的生产,该工艺是通过如下方式进行的:对光子,电子,X射线和离子束敏感,其中要结构化的实际层是通过湿法或干法蚀刻程序通过辅助层构成的,该辅助层至少包含三种金属或金属氧化物,在生产了待构造的层(2、3、4、5、6)之后,直到构造过程开始,应用了钝化最外面的辅助层(6)的附加层(7) 。

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