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Time dependent signal measurement for microelectronic components - using probe to detect sec. particles from specimen with measurement of pulse response

机译:微电子元件的时间相关信号测量-使用探头检测秒。来自标本的颗粒,并测量脉冲响应

摘要

Time dependent signals are measured by detecting secondary particles released from a specimen by a pulsed particle probe. The probe is placed at a first measurement position at which a first time-dependent signal is measured using the sampling principle with a first pulse width and then with a second pulse width. The pulse resopnse or transfer function of the measurement system is determined from the signal measured with the larger pulse width and using the shorter pulse measurement for spreading. A second signal is measured at the same or a different position using the larger pulse width and by using the pulse response or transfer function for spreading.
机译:通过检测由脉冲颗粒探针从样品中释放的次级颗粒来测量时间相关信号。将探头放置在第一测量位置,在该位置使用采样原理以第一脉冲宽度然后以第二脉冲宽度测量第一时间相关信号。测量系统的脉冲响应或传递函数是由以较大脉冲宽度测量的信号和以较短的脉冲测量扩展的信号确定的。使用较大的脉冲宽度并使用脉冲响应或传递函数进行扩展,可以在相同或不同位置测量第二个信号。

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