Specimen holder for holding specimen stubs to be coated in an ion- beam sputter coating unit

摘要

A specimen holder for use in an ion beam sputter coating machine to prepare a specimen placed on a specimen stub for analysis by a scanning electron microscope. The specimen holder is comprised of two planar members, each containing a plurality of openings sufficient in size to hold a specimen stub, with screws projecting through the lip of the upper planar member to allow the specimen holder to securely hold the specimen stubs within the openings in the planar member. The lower planar member has a limited rotation, in relation to the upper planar member, to prevent the specimen stubs from falling through the openings in the specimen holder.