首页> 外国专利> DIRECT ANALYZER OF MOLTEN METAL IN DEEP LAYER BY FINE PARTICLE GENERATING PLASMA EMISSION SPECTROCHEMICAL METHOD

DIRECT ANALYZER OF MOLTEN METAL IN DEEP LAYER BY FINE PARTICLE GENERATING PLASMA EMISSION SPECTROCHEMICAL METHOD

机译:精细粒子产生等离子体发射光谱法直接分析深层金属

摘要

PURPOSE:To analyze directly molten metal constituents simply and rapidly at a working site by taking in a molten metal in a deep layer to a probe by removing a slag with a prescribed cap, and introducing fine particles evaporated by a spark discharge to an analyzer together with inert gas. CONSTITUTION:When a refractory cylinder 11 is lowered while blowing gaseous Ar, the cap 41 removes the slag and the molten metal in the deep layer is taken in. Next the spark discharge is performed between a counter electrode 8 and a sample electrode 17, and the fine particles evaporated and generated are sent to a plasma torch 29 together with gaseous Ar, excited and emitted to measure each constituent content. Thus, the direct analysis can be carried out simply at the working site.
机译:目的:通过在深层中将熔融金属带入探头中,并去除带有规定盖的炉渣,然后将火花放电蒸发的细小颗粒一起引入分析仪中,从而在工作现场简单,快速地直接分析熔融金属成分用惰性气体。组成:在吹送气态Ar的同时降低耐火缸11的高度时,盖41清除了炉渣,并取下了深层中的熔融金属。接下来,在对电极8和样品电极17之间执行火花放电,蒸发和产生的细小颗粒与气态Ar一起送入等离子炬29,激发并发射出去以测量每种成分的含量。因此,直接分析可以简单地在工作现场进行。

著录项

  • 公开/公告号JPH0149892B2

    专利类型

  • 公开/公告日1989-10-26

    原文格式PDF

  • 申请/专利权人 NIPPON STEEL CORP;

    申请/专利号JP19830030777

  • 发明设计人 SAEKI MASAO;ONO AKIHIRO;

    申请日1983-02-28

  • 分类号G01N21/73;

  • 国家 JP

  • 入库时间 2022-08-22 06:42:26

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