SYSTEM FOR CONCURRENCY TESTING OF TRANSMITTERS AND COMPARATORS OF DIGITAL IC MEASURING TESTER HEADS

摘要

Circuit for testing the time concurrence of transmitters and comparators of measurement heads of testers of digital integrated circuits, consisting of a transmitter and comparator activated by separate synchronized signal sources, and containing a time measurement unit, characterized in that the inputs of the tested transmitters (N1,...,Nn) are connected to the outputs of a demultiplexer (DM), whose input is connected to the output of a pulse generator (GI) and via a delaying line (LI) to the input of a standard transmitter (NW), where the output of that transmitter is connected to the input of a standard comparator (KW) and to the third contact (3) of the switch (PW) of that comparator, while the outputs of the tested transmitters (N1,...,Nn) are connected to the inputs of the tested comparators (K1,...,Kn) and to the third contacts (3) of the switches (P1,...,Pn) of those comparators, and the output of the standard comparator (KW) is connected via the first contact (1) and second contact (2) of the switch (PW) of that comparator and a second delaying line (L2) to the reference input (IW) of a converter of time intervals to voltage (PC), while the outputs of the tested comparators (K1,...,Kn) are connected via the first contact (1) and second contact (2) of the switches (P1,...,Pn) of those comparators and via a multiplexer (M) to the measurement output (IX) of that converter, whose output is connected to the input of a converter of voltage to digital code (AC), where the pulse generator (GI), the demultiplexer (DM), the multiplexer (M), the switch (PW) of the standard comparator and the switches (P1,...,Pn) of the tested comparators, [...]IMAGE