首页>
外国专利>
SYSTEMS FOR THE DIRECT ANALYSIS OF SOLID SAMPLES BY ATOMIC EMISSION SPECTROSCOPY.
SYSTEMS FOR THE DIRECT ANALYSIS OF SOLID SAMPLES BY ATOMIC EMISSION SPECTROSCOPY.
展开▼
机译:原子发射光谱直接分析固体样品的系统。
展开▼
页面导航
摘要
著录项
相似文献
摘要
an analysis system for analyzing solid samples by direct atomic emission spectroscopy, atomic spectral lamp uses a (1) of the type for the analysis of a solid sample to be prepared in case the lamp cathode to be e (1).a device (2) for generating a first electric discharge by sputtering from the sample via a connection (8) and a second discharge wire for analytical emission via a connection (9), a device for the analysis of the spectral wavelength. (4) intended to receive, and to determine the intensity of spectral lines emitted by the lamp (1).and a control device (3) of the system, the level of current to the cathode of the sample, and the operation of the system for analysis of spectral wavelength (4) is controlled on the basis of the output from the photomultiplier tube (7).in such a way that the intensities of the spectral lines is optimized, and the relationship between the intensity of spectral lines, and the concentration of the corresponding element in the sample is maintained in a substantially linear region.
展开▼