首页> 外国专利> SYSTEMS FOR THE DIRECT ANALYSIS OF SOLID SAMPLES BY ATOMIC EMISSION SPECTROSCOPY.

SYSTEMS FOR THE DIRECT ANALYSIS OF SOLID SAMPLES BY ATOMIC EMISSION SPECTROSCOPY.

机译:原子发射光谱直接分析固体样品的系统。

摘要

an analysis system for analyzing solid samples by direct atomic emission spectroscopy, atomic spectral lamp uses a (1) of the type for the analysis of a solid sample to be prepared in case the lamp cathode to be e (1).a device (2) for generating a first electric discharge by sputtering from the sample via a connection (8) and a second discharge wire for analytical emission via a connection (9), a device for the analysis of the spectral wavelength. (4) intended to receive, and to determine the intensity of spectral lines emitted by the lamp (1).and a control device (3) of the system, the level of current to the cathode of the sample, and the operation of the system for analysis of spectral wavelength (4) is controlled on the basis of the output from the photomultiplier tube (7).in such a way that the intensities of the spectral lines is optimized, and the relationship between the intensity of spectral lines, and the concentration of the corresponding element in the sample is maintained in a substantially linear region.
机译:一个用于通过直接原子发射光谱法分析固体样品的分析系统,原子光谱灯使用类型(1)来分析要制备的固体样品,如果灯的阴极为e(1)。设备(2 )用于通过连接件(8)通过溅射从样品产生第一放电,以及通过连接件(9)用于分析发射的第二放电线(用于光谱波长分析的装置)。 (4)旨在接收并确定灯(1)和系统的控制装置(3)发出的光谱线的强度,流向样品阴极的电流水平以及基于光电倍增管(7)的输出控制光谱波长分析系统(4),以使光谱线的强度最优化以及光谱线强度之间的关系以及样品中相应元素的浓度保持在基本线性的区域。

著录项

  • 公开/公告号EP0264397A4

    专利类型

  • 公开/公告日1989-05-30

    原文格式PDF

  • 申请/专利权人 CHAMBER RIDGE PTY. LTD.;

    申请/专利号EP19870902334

  • 发明设计人 LUCAS MICHAEL ALFRED;HUGHES TERRY CHARLES;

    申请日1987-04-15

  • 分类号G01N21/67;G01J3/443;

  • 国家 EP

  • 入库时间 2022-08-22 06:34:41

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