首页> 外国专利> KIT FOR CONVERTING A STANDARD MICROSCOPE INTO, AND DESIGN FOR, A SINGLE APERTURE CONFOCAL SCANNING EPI-ILLUMINATION MICROSCOPE

KIT FOR CONVERTING A STANDARD MICROSCOPE INTO, AND DESIGN FOR, A SINGLE APERTURE CONFOCAL SCANNING EPI-ILLUMINATION MICROSCOPE

机译:用于将标准显微镜转换为单孔共聚焦扫描电镜的显微镜的工具包

摘要

A microscope design for, and a kit to convert a standard epi-illumination microscope into a single aper­ture confocal scanning epi-illumination microscope com­prises an assembly including, in one embodiment, a pair of intermediate lenses (28, 32) to create a second field plane (70) conjugate to the specimen plane (68) in both the incident and reflected light paths, with a single aper­ture positioned at this second conjugate field plane and controllably scanned through the plane to create the inci­dent light beam as well as to mask the returning light be­fore viewing. In a second embodiment, only a single lens (128) is included in the assembly and the objective lens may be positioned at its correct tube length, or a non-­standard objective lens (152) may be used to prevent un­desired degradation of the image. This assembly conveni­ently mounts to the nosepiece of the standard microscope in place of the objective lens, and the objective lens mounts to the assembly.
机译:显微镜设计以及用于转换显微镜的套件标准落射照明显微镜成一个单孔共聚焦扫描落射照明显微镜具有一个组件,在一个实施例中,该组件包括一对中间透镜(28、32)的第二场在两个平面中共轭到样品平面(68)的平面(70)入射光和反射光路,一个光圈定位在第二共轭场平面上通过飞机可控地扫描以创建信号凹痕光束以及遮盖返回光前看。在第二实施例中,仅单个透镜(128)包含在组件和物镜中可能以正确的管长放置,或者非标准物镜(152)可用于防止所需的图像质量下降。本届大会牢固地安装在标准显微镜的镜架上代替物镜和物镜安装到装配体。

著录项

  • 公开/公告号EP0339061A1

    专利类型

  • 公开/公告日1989-11-02

    原文格式PDF

  • 申请/专利权人 WASHINGTON UNIVERSITY;

    申请/专利号EP19880908912

  • 发明设计人 SUNDERLAND WILLIAM J.;LICHTMAN JEFFREY W.;

    申请日1988-09-20

  • 分类号G02B21/00;G02B21/08;

  • 国家 EP

  • 入库时间 2022-08-22 06:33:47

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