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Device for polarising microscopes (polarising-light microscopes) for measuring the spatial orientation of grains of a structure

机译:偏光显微镜(偏光显微镜)的装置,用于测量结构晶粒的空间方向

摘要

The invention is used for structure analyses in the area of the geosciences and to the material and product control of technical minerals (stones), coarse and fine ceramics and silica products (refractories). The object is solved according to the invention by a device mentioned above, consisting of a computer, a graphics unit, and a universal stage (universal revolving table) known per se by constructing the measuring circles in the form of a rotatable encoding disc and integrating them in one opto-electronic angular measuring device respectively. According to the invention, the first and second opto-electronic angular measuring devices and their elements are arranged in a mutually defined manner. The measuring circle which conventionally lies horizontally with respect to the axis A1 is arranged vertically. IMAGE
机译:本发明用于地球科学领域中的结构分析以及用于技术矿物(石头),粗,细陶瓷和二氧化硅产品(耐火材料)的材料和产品控制。根据本发明,该目的通过一种上述的装置来解决,该装置包括计算机,图形单元和本身已知的通用台(通用旋转台),其通过以可旋转的编码盘的形式构造测量环并集成来实现。它们分别装在一个光电角度测量装置中。根据本发明,第一和第二光电角度测量装置及其元件以相互限定的方式布置。通常相对于轴线A1水平放置的测量圆是垂直布置的。 <图像>

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