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Device for polarising microscopes (polarising-light microscopes) for measuring the spatial orientation of grains of a structure
Device for polarising microscopes (polarising-light microscopes) for measuring the spatial orientation of grains of a structure
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机译:偏光显微镜(偏光显微镜)的装置,用于测量结构晶粒的空间方向
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摘要
The invention is used for structure analyses in the area of the geosciences and to the material and product control of technical minerals (stones), coarse and fine ceramics and silica products (refractories). The object is solved according to the invention by a device mentioned above, consisting of a computer, a graphics unit, and a universal stage (universal revolving table) known per se by constructing the measuring circles in the form of a rotatable encoding disc and integrating them in one opto-electronic angular measuring device respectively. According to the invention, the first and second opto-electronic angular measuring devices and their elements are arranged in a mutually defined manner. The measuring circle which conventionally lies horizontally with respect to the axis A1 is arranged vertically. IMAGE
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