首页> 外国专利> Method and device for non-destructive measurement of the cupric (copper (II)) oxide/cuprous (copper (I)) oxide ratio on the oxidised internal wall of a copper tube

Method and device for non-destructive measurement of the cupric (copper (II)) oxide/cuprous (copper (I)) oxide ratio on the oxidised internal wall of a copper tube

机译:用于无损测量铜管氧化内壁上的氧化铜(II)/氧化亚铜(I)的方法和装置

摘要

The invention relates to a method for non-destructive measurement of the cupric (copper (II)) oxide/cuprous (copper (I)) oxide ratio on the oxidised internal wall of a copper tube 3. Measurements are taken of the intensity I1 after reflection from the said internal wall, of a measurement light beam with a wavelength lambda 1 approximately corresponding to one of the absorption maxima of cuprous (copper (I)) oxide, and of the intensity I2 after reflection from the said internal wall of a comparison light beam with a wavelength lambda 2 chosen amongst the most sensitive to absorption by cupric (copper (II)) oxide, the two beams coming from the same source and covering an identical path in the copper tube; then the ratio X = I1/I2 is taken, from which the ratio Y = CuO/Cu2O is deduced in a one-to-one relationship. Preferably, the wavelength of the measurement beam is 450 nm for stoichiometric cuprous (copper (I)) oxide and 550 nm for non-stoichiometric cuprous (copper (I)) oxide, and the wavelength of the comparison beam is chosen at approximately 700 nm. IMAGE
机译:本发明涉及一种无损测量在铜管3的氧化内壁上的氧化铜(II)/氧化亚铜(I)的方法。波长λ1大约对应于氧化亚铜(I)氧化物的吸收最大值和从所述内壁反射后的强度I 2的测量光束从所述内壁的反射。在对氧化铜吸收最敏感的波长中选择波长为2的光束,这两个光束来自同一光源,并覆盖铜管中的同一路径;然后取比率X = I1 / I2,从中得出比率Y = CuO / Cu2O一一对应。优选地,对于化学计量的亚铜(I),测量束的波长是450nm,对于非化学计量的铜(I)氧化物,测量束的波长是550nm,并且比较束的波长选择为大约700nm。 。 <图像>

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