首页>
外国专利>
Method and device for non-destructive measurement of the cupric (copper (II)) oxide/cuprous (copper (I)) oxide ratio on the oxidised internal wall of a copper tube
Method and device for non-destructive measurement of the cupric (copper (II)) oxide/cuprous (copper (I)) oxide ratio on the oxidised internal wall of a copper tube
展开▼
机译:用于无损测量铜管氧化内壁上的氧化铜(II)/氧化亚铜(I)的方法和装置
展开▼
页面导航
摘要
著录项
相似文献
摘要
The invention relates to a method for non-destructive measurement of the cupric (copper (II)) oxide/cuprous (copper (I)) oxide ratio on the oxidised internal wall of a copper tube 3. Measurements are taken of the intensity I1 after reflection from the said internal wall, of a measurement light beam with a wavelength lambda 1 approximately corresponding to one of the absorption maxima of cuprous (copper (I)) oxide, and of the intensity I2 after reflection from the said internal wall of a comparison light beam with a wavelength lambda 2 chosen amongst the most sensitive to absorption by cupric (copper (II)) oxide, the two beams coming from the same source and covering an identical path in the copper tube; then the ratio X = I1/I2 is taken, from which the ratio Y = CuO/Cu2O is deduced in a one-to-one relationship. Preferably, the wavelength of the measurement beam is 450 nm for stoichiometric cuprous (copper (I)) oxide and 550 nm for non-stoichiometric cuprous (copper (I)) oxide, and the wavelength of the comparison beam is chosen at approximately 700 nm. IMAGE
展开▼