Infrared microscope employing a projected field stop

摘要

An infrared microscope is disclosed in which two adjustable field stops are included. One is used to determine the illuminated area at the sample when the microscope is used in the transmission mode. The other is used to determine the illuminated area at the sample when the microscope is used in the reflectance mode. The latter field stop is imaged in the plane of the former; and the radiation in the reflectance mode passes through the former field stop both as it passes to the sample and as it returns from the sample after reflectance.