首页> 外国专利> Detection of surface impurity phases in high T.sub.C superconductors using thermally stimulated luminescence

Detection of surface impurity phases in high T.sub.C superconductors using thermally stimulated luminescence

机译:使用热激发发光检测高温超导体中的表面杂质相

摘要

Detection of surface impurity phases in high-temperature superconducting materials. Thermally stimulated luminescence has been found to occur in insulating impurity phases which commonly exist in high- temperature superconducting materials. The present invention is sensitive to impurity phases occurring at a level of less than 1% with a probe depth of about 1 &mgr;m which is the region of interest for many superconductivity applications. Spectroscopic and spatial resolution of the emitted light from a sample permits identification and location of the impurity species. Absence of luminescence, and thus of insulating phases, can be correlated with low values of rf surface resistance.
机译:高温超导材料中表面杂质相的检测。已经发现在高温超导材料中普遍存在的绝缘杂质相中会发生热激发发光。本发明对以小于1%的水平出现的杂质相敏感,探针深度约为1μm,这是许多超导应用的关注区域。从样品发出的光的光谱和空间分辨率允许识别和定位杂质种类。发光的缺乏以及因此绝缘相的缺乏可以与低射频表面电阻值相关。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号