首页> 外国专利> Ketsugoshindoshiuehanoshuhasuondokeisuchoseihoho

Ketsugoshindoshiuehanoshuhasuondokeisuchoseihoho

机译:结论新城市华夫饼的主要莲花温度计

摘要

PURPOSE:To improve the yield of temperature characteristics and to perform mass production, by measuring the resonance frequency at two arbitrary temperatures actually, obtaining the primary temperature coefficient with calculation and adjusting the primary temperature coefficient with etching. CONSTITUTION:The external shape of an oscillator is formed with etching. Next, the oscillator is located at arbitrary temperatures t1 and t2 and the resonance frequencies f1 and f2 for the temperatures are obtained. The primary temperature coefficient alpha is obtained from the temperatures t1, t2 and the resonance frequencies f1, f2 with calculation. The etching time is determined with the value of the coefficient alpha and the coefficient alpha is made to almost zero with the etching. Through this method, the yield of the temperature characteristics can be improved, a lot of processing can be done at a time, resulting that the cost down can be attained.
机译:用途:为提高温度特性的产量并进行批量生产,实际上是在两个任意温度下测量共振频率,通过计算获得初级温度系数,并通过蚀刻调整初级温度系数。组成:振荡器的外部形状是通过蚀刻形成的。接下来,将振荡器置于任意温度t1和t2,并获得该温度的谐振频率f1和f2。通过计算从温度t1,t2和谐振频率f1,f2获得初级温度系数α。蚀刻时间由系数α的值确定,并且通过蚀刻使系数α几乎为零。通过这种方法,可以提高温度特性的合格率,一次可以进行大量处理,从而可以降低成本。

著录项

  • 公开/公告号JPH0235490B2

    专利类型

  • 公开/公告日1990-08-10

    原文格式PDF

  • 申请/专利权人 SEIKO INSTR & ELECTRONICS;

    申请/专利号JP19810161590

  • 发明设计人 KAWASHIMA HIROFUMI;

    申请日1981-10-09

  • 分类号H03H3/04;

  • 国家 JP

  • 入库时间 2022-08-22 06:22:11

获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号