首页> 外国专利> SIMULTANEOUS MEASURING SYSTEM FOR SPEED, DIAMETER AND REFRACTIVE INDEX OF PARTICLE BY MULTIPLE FOCAL POINT METHOD USING LASER

SIMULTANEOUS MEASURING SYSTEM FOR SPEED, DIAMETER AND REFRACTIVE INDEX OF PARTICLE BY MULTIPLE FOCAL POINT METHOD USING LASER

机译:激光多焦点法同时测量粒子速度,直径和折射率的系统

摘要

PURPOSE:To make it possible to measure the speed, diameter and refractive index of a particle simply and accurately by using multiple interferences of a diffraction grating, and forming sharp interference fringes. CONSTITUTION:The diameter of a laser beam is expanded through lenses l1 and l2. The laser beam is diffracted through a diffraction grating d.g. and made to be parallel light beams through a lens l3. Thereafter, sharp interference fringes (multiple focal points) which are condensed on a focal plane at the rear side of the lens l3 are used for measurement. As the diffraction grating d.g., a pulse-width modulated phase diffraction grating is used. Apertures a1 and a2 are used for selecting only a time when a particle passes the central orbit of multiple focal point. The reflected light and the refracted light are received with detectors PD1 and PD2. The speed of the particle can be obtained from the period of a signal which is obtained from the reflected light that is generated when the particle passes the multiple focal points. The reflected light is detected with the detector PD2, and then the refracted light is detected with the detector PD1. Furthermore, the refracted light is observed with the PD2, and the reflected light is observed with the PD1. Therefore, the diameter and the refractive index of the particle are obtained based on the time delay of the signals obtained with the PD1 and the PD2.
机译:目的:通过使用衍射光栅的多重干涉并形成清晰的干涉条纹,可以简单,准确地测量粒子的速度,直径和折射率。组成:激光束的直径通过透镜l1和l2扩展。激光束通过衍射光栅d.g被衍射。并通过透镜l3成为平行光束。此后,使用在透镜13的后侧的焦平面上会聚​​的尖锐干涉条纹(多个焦点)进行测量。作为衍射光栅d,例如使用脉宽调制相位衍射光栅。孔径a1和a2仅用于选择粒子通过多个焦点的中心轨道的时间。反射光和折射光被检测器PD1和PD2接收。可以从信号的周期中获得粒子的速度,该信号的周期是由当粒子通过多个焦点时产生的反射光获得的。用检测器PD2检测反射光,然后用检测器PD1检测折射光。此外,用PD2观察到折射光,用PD1观察到反射光。因此,基于用PD1和PD2获得的信号的时间延迟来获得颗粒的直径和折射率。

著录项

  • 公开/公告号JPH0290037A

    专利类型

  • 公开/公告日1990-03-29

    原文格式PDF

  • 申请/专利权人 NAKATANI NOBORU;

    申请/专利号JP19880242180

  • 发明设计人 NAKATANI NOBORU;

    申请日1988-09-27

  • 分类号G01N15/14;G01B11/08;G01N21/41;G01N21/53;G01P3/36;

  • 国家 JP

  • 入库时间 2022-08-22 06:20:48

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