METHOD AND DEVICE FOR LARGE-SCALE PROFILOMETRIC MEASUREMENT AND THEIR APPLICATIONS TO THE MEASUREMENT OF THE SURFACE CONDITION OF ANY TYPE OF FORM

摘要

The invention relates to a process and a device for large-scale profilometric measurement and their application to the measurement of the condition of surfaces, irrespective of shape. The device, which makes it possible to apply the process according to the invention, consists of a non-loaded plate (1) sliding along a plane (X, Y), a thin steel blade (2) which ensures the connection between a block (3) and a support carriage (4), a sensor (5) and a vertical displacement unit (7) which ensures the contact between the surface to be explored (6) and the sensor probe (5). A support (8) for the datum surface (10) is placed on the table (9).