MULTI-WAVELENGTH SPECTROSCOPIC METHOD AND MULTI-WAVELENGTH SPECTROSCOPE

摘要

PURPOSE:To obtain a smooth spectrum by moving the relative position of an incident slit in a widthwise direction within a range corresponding to a pitch of a photodetecting element. CONSTITUTION:A slit position driving mechanism 12 is provided in a multi- wavelength spectroscope. After the measuring amount of light by all of the photodetecting elements of an image detector 3 are taken out by a scanner circuit 5, a spectrum of 512 measuring points of wavelength is stored in a memory circuit 8. Every time one spectrum is obtained, a digital computer 9 generates a slit moving command to the mechanism 12, so that an incident slit 21 is moved a predetermined distance smaller than the distance corresponding to the pitch of the photodetecting elements of the detector 3. Then, after the position of the incident slit is moved, a spectrum of 512 second measuring points of wavelength shifted a predetermined wavelength from the first spectrum is measured and stored in the circuit 8. N spectra are overlapped through the operation of the computer 9 thereby to obtain one spectrum of 512XN measuring points. This is a smooth spectrum interpolated with the fineness of 1/Nnm.