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IMPACT FRACTURE TEST METHOD FOR ELECTRONIC PARTS

机译:电子零件冲击断裂试验方法

摘要

PURPOSE:To accurately measure the impact fracture toughness of an electronic parts by supplying impact due to the drop of a weight to a sample as point impact via a tip pointed identer. CONSTITUTION:The tip pointed identer 8 is placed on the electronic parts 7 setting its tip side downward, and a crack is generated in the electronic parts 7 by dropping the weight at the base side of the identer 8, and also, a load applied from the weight to the electronic parts 7 is detected with a load detector 4 provided under the electronic parts 7 is advance. Also, by measuring the load generating the crack on the electronic parts 7 with an AE(acoustic emission) sensor 10 by using an AE wave in advance, the height of the weight by which the crack is generated can be adjusted. The length of a developed crack is measured, and the impact fracture toughness of the electronic parts 7 can be found based on a measured value and a load detection value.
机译:目的:通过尖端尖的识别器提供由于样品重量下降而产生的冲击作为点冲击,从而准确地测量电子零件的冲击断裂韧性。组成:尖端识别器8放置在电子部件7上,使其尖端侧朝下,并且通过降低识别器8底部的重量,电子部件7中会产生裂纹,并且,通过设置在电子部件7下方的载荷检测器4来检测电子部件7的重量。另外,通过预先通过使用AE波来利用AE(声发射)传感器10测量在电子部件7上产生裂纹的载荷,可以调节产生裂纹的重物的高度。测量所产生的裂纹的长度,并且可以基于测量值和负荷检测值来找到电子部件7的冲击断裂韧性。

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