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IMPACT FRACTURE TEST METHOD FOR ELECTRONIC PARTS
IMPACT FRACTURE TEST METHOD FOR ELECTRONIC PARTS
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机译:电子零件冲击断裂试验方法
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摘要
PURPOSE:To accurately measure the impact fracture toughness of an electronic parts by supplying impact due to the drop of a weight to a sample as point impact via a tip pointed identer. CONSTITUTION:The tip pointed identer 8 is placed on the electronic parts 7 setting its tip side downward, and a crack is generated in the electronic parts 7 by dropping the weight at the base side of the identer 8, and also, a load applied from the weight to the electronic parts 7 is detected with a load detector 4 provided under the electronic parts 7 is advance. Also, by measuring the load generating the crack on the electronic parts 7 with an AE(acoustic emission) sensor 10 by using an AE wave in advance, the height of the weight by which the crack is generated can be adjusted. The length of a developed crack is measured, and the impact fracture toughness of the electronic parts 7 can be found based on a measured value and a load detection value.
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