首页> 外国专利> MEASUREMENT OF REFRACTIVE INDEX DISTRIBUTION FOR OPTICAL FIBER BASE MATERIAL WITH HIGH NUMERICAL APERTURE

MEASUREMENT OF REFRACTIVE INDEX DISTRIBUTION FOR OPTICAL FIBER BASE MATERIAL WITH HIGH NUMERICAL APERTURE

机译:高数值孔径的光纤基材料折射率分布的测量。

摘要

PURPOSE:To enable measurement of a refractive index distribution in noway affected by high-order diffraction light without drawing an optical fiber base material with a high numerical aperture, by providing a slit on the emission side to withdraw and measure a specified diffraction light spot. CONSTITUTION:Light beam 12 from an He-Ne laser 10 is made incident into a base material 20 in a matching oil 18 through a lens 16. The base material 20 employs an optical fiber base material with a high numerical aperture sintered without being drawn. Light emitted from the base material 20 is bent at an angle phi by a refractive index distribution to be incident into a line sensor 26 passing through a lens 22 and cylindrical lens 24. Then, a slit 40 is provided between the lenses 22 and 24 to withdraw a specified diffraction light from among emission light patterns and the diffraction light is analyzed one- dimensionally. This enables measurement of angle phi of refraction of light beam in noway affected by a high-order diffraction light spot.
机译:目的:通过在发射侧设置一个狭缝以退出并测量特定的衍射光斑,从而能够在不绘制具有高数值孔径的光纤基材的情况下,在不受高阶衍射光影响的情况下测量折射率分布。组成:来自氦氖激光器10的光束12通过透镜16入射到匹配油18中的基础材料20中。基础材料20采用的是烧结有高数值孔径的光纤基础材料,没有被拉伸。从基材20发出的光通过折射率分布以角度φ弯曲,以入射到穿过透镜22和柱面透镜24的线传感器26中。然后,在透镜22和24之间设置狭缝40以从发射光图案中提取特定的衍射光,并对衍射光进行一维分析。这使得能够在无论如何受高阶衍射光斑影响的情况下测量光束的折射角φ。

著录项

  • 公开/公告号JPH0364817B2

    专利类型

  • 公开/公告日1991-10-08

    原文格式PDF

  • 申请/专利权人 FUJIKURA LTD;

    申请/专利号JP19860240782

  • 发明设计人 YAMAUCHI RYOZO;KISHI HAJIME;

    申请日1986-10-10

  • 分类号G02B6/00;G01M11/02;G01N21/41;G01N21/47;

  • 国家 JP

  • 入库时间 2022-08-22 06:02:36

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号