linear rueckgekoppeltes shift register to gueltigkeitsbestaetigung in schaltungsentwurftechnologie.

摘要

An apparatus and process employing an integrated circuit device technology within a linear feedback shift register using a cyclic redundancy check code scheme for validating the device technology under realistic very large scale integrated circuit operating conditions. By deploying two feedback shift registers in a full-duplex mode, the device technology can be subjected to arbitrarily-long, pseudo-random test signal sequences. Also, by checking the registers with variable-phase pulses, representative device delay time information can be obtained.