A METHOD AND A DEVICE FOR MEASURING THE HEIGHT OF MATERIAL PIECES

摘要

The invention relates to a method and a device for measuring the height of material pieces. It is previously known to measure the height of a material piece (2) by illuminating it from the side and measuring the width of a shadow falling on a detector (4). If several material pieces lie side by side on a surface (1), this prior art method cannot be applied. The height of the material pieces (2) can be measured individually by illuminating the material piece (2) obliquely from above in such a manner that a shadow (7) is formed upon the surface beside the material piece (2), and the length (B) of the shadow is measured. The length (B) of the shadow (7) gives the height of the material piece.