Six-port reflectometer test arrangement

摘要

A test arrangement for testing high frequency electrical devices consists of two 6-port reflectometers (40, 41) which are both connected to a device under test (2),. As well as being applied to the device under test, a reference sample of an excitation signal is routed to both 6-port reftectometers simultaneously. The test arrangement is capable of very wide operation and is able to fully characterise the electrical properties of a device.