Contact-pins arrangement for the electrical contacting of a test device with circular contact surfaces of a test sample

摘要

The contact pin arrangement exhibits below an embedment of the contact pins (2) in a plastic compound, a stack (1, 1a) of perforated plates through which the contact pins extend. The stack of perforated plates consists of two types of perforated plates. The first one is formed by the lowermost perforated plates (1a). They exhibit round or square holes which ensure a perpendicular placement of the contact pins on the contact areas (4) of the test specimen (5). The perforated plates (1) of the second type exhibit nothing but elongated holes, rectangular, square, circular, elliptic or trapezoidal holes (3). Of in each case three perforated plates of the second type stacked on top of one another, the centre one is offset with respect to the other two which are aligned with one another, in such a manner that each contact pin is enclosed by a part of the lower edge of the hole of the top and a part of the upper edge of the hole of the centre and by a part of the lower edge of the hole of the centre and a part of the upper edge of the hole of the lower perforated plate. As a result, the contact pin can bend at the most to the part of the hole wall limiting its maximum bending with an axial load. This ensures a sufficiently low contact resistance between the contact pin and the contact area of the test specimen. The contact pins can be adapted to differences in the height of the contact areas of the test specimen due to unevennesses of the surface of the test specimen by a correspondingly selected number of perforated plates of the second type. IMAGE