Chip identification method for use with scan design systems and scan testing techniques

摘要

A method and apparatus are provided for uniquely identify­ing integrated circuit chips adapted for use with scan design systems and scan testing techniques. A predeter­mined identification number corresponding to each LSS chip to be identified is assigned. Each predetermined identi­fication number has a predefined format. The assigned identification number is stored in a plurality of prede­fined shift register latches (SRLs) (14-18) in the corre­sponding LSI chip to be identified. Then the LSI chip is identified by selectively reading out the stored predeter­mined identification number.