METHOD FOR MEASURING THE NONLINEARITY OF ELECTRON BEAM DEFLECTIONIN CATHODE-RAY TUBES

摘要

the invention u043eu0442u043du043eu0441u0438u0442u0441u00a0 to u0440u0430u0434u0438u043eu0438u0437u043cu0435u0440u0438u0442u0435u043bu044cu043du043eu0439 technology and can be used for testing u043eu0442u043au043bu043eu043du00a0u044eu0449u0438u0445 systems from cathode-ray tubes (crt). the purpose of u0438u0437u043eu0431u0440u0435u0442u0435u043du0438u00a0 - improved accuracy u0438u0437u043cu0435u0440u0435u043du0438u00a0 nonlinear distortions of u0440u0435u0437u0432u0435u0440u0442u043au0438 by u0443u0432u0435u043bu0438u0447u0435u043du0438u00a0 lines between nodes of a network. on the screen of crt u043du0430u043au043bu0430u0434u044bu0432u0430u0435u0442u0441u00a0 u043cu0430u0441u0448u0442u0430u0431u043du0430u00a0 mesh, nodes which are miniature optical sensors.on the crt display u0432u043eu0441u043fu0440u043eu0438u0437u0432u043eu0434u00a0u0442 u043fu0440u00a0u043cu043eu0443u0433u043eu043bu044cu043du044bu0439 raster, with small frequency ratio to the personnel u043eu0442u043bu0438u0447u0430u0435u0442u0441u00a0 from whole number equal to 1 /. when measuring the nonlinearity of the shot is equivalent to an increase of frequency in lowercase to time and an increase in the accuracy of the measurements.this choice u043eu0442u043du043eu0448u0435u043du0438u00a0 lowercase frequency to improve the accuracy of personnel u043fu043eu0437u0432u043eu043bu00a0u0435u0442 u043eu043fu0440u0435u0434u0435u043bu0435u043du0438u00a0 nodal points to values u043eu043fu0440u0435u0434u0435u043bu00a0u0435u043cu044bu0445 resolution of crt and u0444u043eu0442u043eu0434u0430u0442u0447u0438u043au043eu0432. 2). fe