METHOD OF X-RAY SPECTRAL ANALYSIS OF QUALITY OF ABRASIVE SURFACE

摘要

the invention u043eu0442u043du043eu0441u0438u0442u0441u00a0 to measuring technology, in particular to the field of u043eu043fu0440u0435u0434u0435u043bu0435u043du0438u00a0 u0440u0435u043du0442u0433u0435u043du043eu0441u043fu0435u043au0442u0440u0430u043bu044cu043du044bu043c method of abrasive particles on the surface of parts, the yu u0438u0437u043eu0431u0440u0435u0442u0435u043du0438u00a0 u00a0u0432u043bu00a0u0435u0442u0441u00a0 increased coverage by u043eu043fu0440u0435u0434u0435u043bu0435u043du0438u00a0 also and the size of abrasive particles.the controlled surface u043fu0440u043eu0432u043eu0434u00a0u0442 by moving the sample or ionizing beam diameter commensurate with the diameter of abrasive particles, namely 2 to 5 microns. dia meter of the abrasive grains u043eu043fu0440u0435u0434u0435u043bu00a0u044eu0442 on u0442u0430u0440u0438u0440u043eu0432u043eu0447u043du043eu0439 curve on the intensity of each u0438u0437u043bu0443u0447u0435u043du0438u00a0 abrasive particles.