Matching aerial reflector to specified ideal reflector contour - determining deviations of aerial reflector from ideal contour at measurement points on surface of reflector

摘要

On the surface of the aerial reflector several measurement points are picked out, at which are determined the deviations of the aerial reflector from the ideal reflector contour, which are minimised by a corresp. shaping of the aerial reflector. The places for the measurement points (3, 5, 5') on the surface of the aerial reflector (1) are so selected, that the remaining store of remaining measurement points of the ideal aerial deflector contour are statistically distributed over the surface of the aerial reflector. The interferences of the radiation diagram resulting from the store, occurs with nearly uniform distribution in all directions. ADVANTAGE - Deviation from ideal reflector contour is kept as small as possible.