首页> 外国专利> Detection and measurement system for micro-magnetic fields - has output from scanning electron microscope directed onto photodiode with electrode matrix

Detection and measurement system for micro-magnetic fields - has output from scanning electron microscope directed onto photodiode with electrode matrix

机译:微磁场检测和测量系统-扫描电子显微镜的输出直接对准带有电极矩阵的光电二极管

摘要

The detection system to measure the micromagnetic or electrical field generated by an object uses a scanning electron microscope. The deflected electron beam falls onto a fluorescent screen that is positioned in front of a window in the housing of the microscope. The transmitted light is focussed onto a photodiode (20). The photodiode has a pair of planar layers (21,22), one of which is a "p" type and the other an "n" type. The surfaces have electrodes (24,26) that are set at 90 degrees to each other on the surfaces. The surfaces are separated by an intrinsic intermediate layer. ADVANTAGE - Provides accurate measurement of micromagnetic field.
机译:用于测量物体产生的微磁场或电场的检测系统使用扫描电子显微镜。偏转的电子束落到荧光屏上,该荧光屏位于显微镜外壳中窗的前面。透射光聚焦在光电二极管(20)上。光电二极管具有一对平面层(21,22),其中一个是“ p”型,另一个是“ n”型。所述表面具有电极(24,26),所述电极在表面上彼此成90度设置。这些表面被本征中间层隔开。优势-提供对微磁场的精确测量。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号