Optoelectronic device for measuring deflection magnitude and direction - sends light with variable intensity to sensor with several receiver surfaces, microprocessor deriving deflection signal

摘要

A light source which emits a beam with intensity varying perpendicularly to the propagation direction can be transversely deflected relative to a receiver connected to an evaluation device. In each deflection position, each of several receiving surfaces (70,72,74,76) only receives a partial beam. - The receiver element (16) contg. the surfaces generates a signal corresp. to the total intensity of incident light. A microprocessor derives the deflection from the signal produced by the evaluation device according to the intensity distribution and the receiver surface geometry.