首页> 外国专利> Investigating relative material effects by characteristic wavelengths - ascertaining characteristic factors such as transmission, dispersion, reflection by spectrophotometry

Investigating relative material effects by characteristic wavelengths - ascertaining characteristic factors such as transmission, dispersion, reflection by spectrophotometry

机译:通过特征波长研究相对材料的影响-确定特征因素,例如分光光度法的透射率,色散和反射

摘要

A microcomputer (1) is connected to a control circuit (5) controlling drive stages (7) for radiation transmitters (8) of various spectra via a multiplexer (6). These transmitters are controlled sequentially and emit at least part of their radiation in the medium to be measured (4). Radiation receivers (9) convert at least part of the transmitted, dispersed or reflected radiation into an electrical value which is amplified (10) and extended to a measuring range charge-over switch (11). The latter is under the control of a control circuit (5) via the first microcomputer. This electrical value is also presented to a filter (12) as well as a sample-and-hold circuit (13) and an A-D converter (14) which are both subject to the control circuit. The microcomputer and a static RAM (15) are in parallel with the A-D converter. USE/ADVANTAGE - In industrial process or research to ascertain opacity, isobaric points and equilibrium dependent spectral sections. Sychronised alignment and detection of signals. Simple 380 point correction. Coupling to higher order computers.
机译:微型计算机(1)通过多路复用器(6)连接到控制电路(5),该控制电路控制用于各种光谱的辐射发射器(8)的驱动级(7)。这些发射器受到顺序控制,并在要测量的介质中发射至少一部分辐射(4)。辐射接收器(9)将透射,分散或反射的辐射的至少一部分转换成电值,该电值被放大(10)并扩展到测量范围充电转换开关(11)。后者在控制电路(5)的控制下通过第一微型计算机。该电值还被呈现给滤波器(12)以及采样保持电路(13)和A-D转换器(14),它们都受控制电路的影响。微型计算机和静态RAM(15)与A-D转换器并行。使用/优势-在工业过程或研究中确定不透明度,等压点和与平衡有关的光谱部分。同步对齐和信号检测。简单的380点校正。耦合到高阶计算机。

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