DISCRIMINANT SPECTROSCOPY OF THE OPTICAL PROFILE OF A TRANSPARENT OBJECT, OBTAINED BY FRAGILE EVANESCENT FIELD SCANNING OPTICAL MICROSCOPY, AND MICROSCOPES OF THIS TYPE IMPLEMENTING SAID METHOD.

摘要

The present invention relates to a method of discriminating spectroscopy for optical microscopy scanning evanescent field frustrated, of the type to obtain the "normal" optical profile of a transparent object, characterized in that it causes a preferentially differential variation of at least one of the physical quantities whose intensity I of the evanescent frustrated field depends, namely: BR/ - the lambda wavelength of the electromagnetic radiation, oriented on the underside of a face of a body transparent, of the type of a prism, and which generates, by total internal reflection, said near field, BR/ - the optical refractive index n1 of said transparent body, BR/ - the average optical refraction index n2 of the transparent object placed on the top of said face, BR/ - and the angle of incidence theta of said electromagnetic radiation on said face, BR/ so as to obtain a concomitant variation dI of said intensity I I, capable of being interpreted as a "differential" optical profile of said transparent object with respect to at least one of said physical magnitudes, or providing a "modified" optical profile of said "normal" optical profile of this object.