首页>
外国专利>
Method and apparatus for investigating the latch-up propagation in complementary-metal-oxide semiconductor (CMOS) circuits
Method and apparatus for investigating the latch-up propagation in complementary-metal-oxide semiconductor (CMOS) circuits
展开▼
机译:用于研究互补金属氧化物半导体(CMOS)电路中闩锁传播的方法和装置
展开▼
页面导航
摘要
著录项
相似文献
摘要
Since known methods for investigating latch-up propagation have only a comparatively slight chronological resolution, a method and apparatus are proposed in which latch-up is periodically triggered and the intensity of the infrared radiation emanating from an integrated circuit is sensed at a plurality of measuring points that cover the circuit in a grid-like manner in order to respectively determine, at the measuring points, within what time span the intensity of the infrared radiation reaches a threshold, and to respectively register a measured value representing the time interval in a location-dependent manner.
展开▼