Array structure for use in an adaptive inference testing device

摘要

An adaptive inference system for testing electrical or electronic devices or assemblies. A mechanism is provided for performing position- dependent, time-ordered tests upon electrical or electronic devices in order to obtain a test data array. A mechanism is also provided to define a reference array containing acceptable data for comparison with test data. A comparator is connected to the test data array and to the reference array for providing an error array. An error array library is also provided, which contains accumulated error data. Finally, an error array comparator is connected between the error array library and the error array providing a diagnostic analysis of the electrical or electronic devices or assemblies.