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FUNCTION TESTING DEVICE FOR MPU-LSI

机译:MPU-LSI的功能测试装置

摘要

PURPOSE:To decide whether an MPU operates normally or not by supplying instructions which are required for a test of the MPU sequentially from an input pattern memory and leading addresses and data which are outputted by the MPU corresponding to the instructions to a comparator. CONSTITUTION:The output of an address bus Ba after reset resetting is led to an address comparator 3a and compared here with an expected vector address value outputted from an output pattern memory 2 to decide a function for initializing respective elements. When an address parameter is inputted from an input pattern 1 to the MPU 10, the MPU 10 outputs the address of a RAM 12 which is indicated by the parameter to an address bus Ba. The comparator 3a compares this address with an expected address value pattern Ps to decide a function for correctly accessing the address of a ROM 11 or the RAM 12. Further, a data comparator 3d compares data which is outputted from a register with the expected value pattern Ps. Consequently, a function which performs specific operation can be decided.
机译:目的:通过从输入模式存储器顺序提供测试MPU所需的指令以及MPU输出的与指令相对应的前导地址和数据,来确定MPU是否正常工作。组成:复位复位后的地址总线Ba的输出被引至地址比较器3a,并与从输出模式存储器2输出的预期向量地址值进行比较,以决定用于初始化各个元素的功能。当从输入模式1将地址参数输入到MPU 10时,MPU 10将由该参数指示的RAM 12的地址输出到地址总线Ba。比较器3a将该地址与期望地址值模式Ps进行比较,以决定用于正确访问ROM 11或RAM 12的地址的功能。此外,数据比较器3d将从寄存器输出的数据与期望值模式进行比较。附言因此,可以确定执行特定操作的功能。

著录项

  • 公开/公告号JPH04100159A

    专利类型

  • 公开/公告日1992-04-02

    原文格式PDF

  • 申请/专利权人 FUJITSU LTD;

    申请/专利号JP19900217374

  • 发明设计人 MIZUSAWA MASAMI;

    申请日1990-08-18

  • 分类号G01R31/317;G06F11/22;

  • 国家 JP

  • 入库时间 2022-08-22 05:45:30

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