首页> 外国专利> METHOD FOR MEASURING REFLECTION COEFFICIENT OF SKEW INCIDENCE WAVE OF OUTER WALL

METHOD FOR MEASURING REFLECTION COEFFICIENT OF SKEW INCIDENCE WAVE OF OUTER WALL

机译:测量外墙斜入射波反射系数的方法

摘要

PURPOSE:To enable a reflection coefficient of a body to be tested to be measured with improved efficiency and accuracy by plotting a reflection wave graph with a computer according to continuous measurement result of a reflection wave level of a skew incidence electromagnetic wave while elevating the body to be tested which is set skewly and a reflection plate which is provided at right angle to it. CONSTITUTION:A reflection plate 20 is provided at right angle to a stage 18 which can be slanted and then a body to be tested 21 is mounted to the stage 18 and is placed directly below a center of transmission and reception antennas 15 and 16. Then, an output frequency of a network analyzer 17 is set to for example 375MHz, distance between the antenna 16 and the body to be tested 21 is measured, a lowering distance of an elevation device 12 is set to 80cm or more since the wavelength is 80cm, thus enabling a measurement frequency and a position information of the antenna 16 and the body to be tested 21 at a position where measurement is started to be inputted to a computer 13. Then, electromagnetic wave is allowed to enter the body to be tested 21 and the plate 20 from the antenna 15, the device 12 is lowered, and a reflection wave level and the position information are automatically measured continuously by automatic control of the computer 13, thus enabling a reflection wave graph to be plotted. Therefore, a reflection coefficient can be measured with improved efficiency and accuracy.
机译:目的:通过倾斜入射电磁波的反射波电平的连续测量结果,用计算机绘制反射波图,从而提高被测物体的反射系数,从而提高效率和精度。倾斜放置的待测物和与之成直角的反射板。组成:一个反射板20与一个可以倾斜的平台18成直角,然后将一个要测试的物体21安装到平台18上,并直接放置在发射和接收天线15和16的中心下方。 ,将网络分析仪17的输出频率设定为例如375MHz,测量天线16与被检体21之间的距离,将波长为80cm的升降装置12的下降距离设定为80cm以上。因此,能够在开始测量的位置处将天线16和被检体21的测量频率和位置信息输入到计算机13。然后,允许电磁波进入被检体21。然后从天线15取下平板20,降低装置12,并通过计算机13的自动控制自动连续测量反射波水平和位置信息,从而使反射波图能够绘制。因此,可以以提高的效率和精度来测量反射系数。

著录项

  • 公开/公告号JPH04155270A

    专利类型

  • 公开/公告日1992-05-28

    原文格式PDF

  • 申请/专利权人 FUJITA CORP;

    申请/专利号JP19900277767

  • 发明设计人 SHIROMIZU KOICHI;

    申请日1990-10-18

  • 分类号G01R29/08;G01N22/00;G01R29/00;

  • 国家 JP

  • 入库时间 2022-08-22 05:42:28

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