首页> 外国专利> MEASURING METHOD OF PROPAGATION SPEED OF ELASTIC WAVE IN SURFACE OF CRYSTAL

MEASURING METHOD OF PROPAGATION SPEED OF ELASTIC WAVE IN SURFACE OF CRYSTAL

机译:晶体表面弹性波传播速度的测量方法

摘要

PURPOSE:To enable measurement of a propagation speed in an arbitrary place or area on the surface of an elastic body crystal by a method wherein an elastic wave is generated by exciting the crystal and the displacement of a strain of the surface of the crystal for a prescribed time is detected by a holographic interference method. CONSTITUTION:A transducer 2 which impresses an electric field of a prescribed frequency on an electrode formed on the surface of a crystal by mask evaporation gives a strain to the crystal 1 to be measured and thereby makes it generate an elastic wave. A laser light outputted from a laser 3 and reflected by a half mirror 5 is reflected further by a reflector 6 and applied onto the surface of the crystal 1, and it turns to be a reflected light therefrom and is led to a holographic processing device 8. Meanwhile, the laser light transmitted through the half mirror 5 is reflected by a reflector 7 and led directly to the holographic processing device 8. In the holographic processing device 8, an instantaneous hologram representing the state in some instant of the surface of the crystal 1 to be measured is formed by the interference of these two lights led through different courses.
机译:目的:为了能够通过一种方法来测量弹性体晶体表面上任意位置或区域的传播速度,其中通过激发晶体产生弹性波以及晶体表面应变的位移。规定时间通过全息干涉法检测。组成:换能器2通过掩模蒸发将规定频率的电场施加在形成于晶体表面的电极上,从而使待测晶体1产生应变,从而使其产生弹性波。从激光器3输出并被半反射镜5反射的激光进一步被反射器6反射并施加到晶体1的表面上,变成来自其的反射光,并被引导至全息处理装置8。同时,透射过半反射镜5的激光被反射镜7反射并直接引导至全息处理装置8。在全息处理装置8中,瞬时全息图表示晶体表面的某一瞬间的状态。被测量的图1是由这两个穿过不同路线的光的干涉形成的。

著录项

  • 公开/公告号JPH04319626A

    专利类型

  • 公开/公告日1992-11-10

    原文格式PDF

  • 申请/专利权人 MEIDENSHA CORP;

    申请/专利号JP19910088029

  • 发明设计人 TAGAWA YOSHIHIKO;

    申请日1991-04-19

  • 分类号G01H5/00;

  • 国家 JP

  • 入库时间 2022-08-22 05:39:46

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