METHOD OF DETERMINING THE ORIENTATION OF CRYSTALLOGRAPHIC AXIS ON PIEZOELECTRIC PLATES

摘要

A method to determine the crystallographic axis direction on piezo-dielectric plates, wherein on the surface of a piezo-dielectric plate (1) there are placed two identical inter-plate transducers (3), (4) at a distance (L) from each other, whereupon a transverse profile (R6) of the amplitude of the surface wave (6) is found at a point in the middle of the said distance (5) by measuring the intensity of the electric field connected with the wave excited by the transducer (3) as a result of the electric signal being applied to it, and a transverse profile (R7) of the amplitude of the surface wave (7) regenerated by the transducer (4) is found, whereupon the length (A) of the linear displacement of anti-symmetrical profiles (R6) and (R7) are measured and the direction (8) of the crystallographic axis of the plate is found from the length (A) and the distance (L).IMAGE