首页> 外国专利> DETECTOR AND MIXER DIODE OPERATIVE AT ZERO BIAS VOLTAGE AND FABRICATION PROCESS THEREFOR

DETECTOR AND MIXER DIODE OPERATIVE AT ZERO BIAS VOLTAGE AND FABRICATION PROCESS THEREFOR

机译:零偏置电压下的检测器和混合二极管操作及其制造工艺

摘要

Abstract of the DisclosureThis invention is directed to an NPIN (orPNIP) diode structure and epitaxial process forfabricating same wherein the thickness and doping levelsof the intermediate layers of the structure are suchthat these layers are substantially depleted of majoritycarriers and therefore enable the structure to beoperated at zero volts DC bias. This structure may beutilized either as an efficient detector diode or amixer diode substantially free of odd order harmonicmixing products, and both devices may be fabricated in asingle molecular beam epitaxial process with theadvantage of high control over epitaxial layer thicknessand impurity concentration.
机译:披露摘要本发明针对一种NPIN(或PNIP)的二极管结构和外延工艺制造其厚度和掺杂水平结构的中间层是这样的这些层基本上已经耗尽载体,因此使结构成为在零伏直流偏置下运行。这种结构可能是用作有效的检测二极管或基本上没有奇次谐波的混频器二极管混合产品,并且两个设备都可以在单分子束外延工艺高度控制外延层厚度的优势和杂质浓度。

著录项

  • 公开/公告号CA1292809C

    专利类型

  • 公开/公告日1991-12-03

    原文格式PDF

  • 申请/专利权人 HEWLETT-PACKARD COMPANY;

    申请/专利号CA19870541844

  • 发明设计人 ZURAKOWSKI MARK P.;

    申请日1987-07-10

  • 分类号H01L29/86;H01L21/04;H01L29/06;H01L29/14;H01L29/91;

  • 国家 CA

  • 入库时间 2022-08-22 05:32:43

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